Design for testability (DFT)
Maximizing the effectiveness of semiconductor
testing thorough
RTL-level quality assessments and advanced
scan methodologies.
Accelerate Testing and Boost Silicon Success with LeadIC Design’s DFT Solutions
LeadIC Design offers robust Design for Testability (DFT) services to streamline the testing process, optimize test coverage, and reduce time-to-market for your silicon products. Our DFT solutions help address the growing complexities of advanced process nodes, ensuring high-quality, low-cost, and scalable test solutions for a variety of semiconductor applications
Our DFT services are designed to minimize testing challenges and maximize yields for ICs in even the most complex environments. We offer a comprehensive set of solutions that cover each stage of the design and testing lifecycle, ensuring seamless integration and optimized test flows.
DFT Capabilities
Scan stitching, compression, and scan architecture development for efficient testability.
Advanced Test Pattern Generation (ATPG) for high fault coverage and cycle time optimization.
- Design and implementation of BIST architecture for robust memory testing.
Ensuring accessibility and effective testing of interconnects.
Leveraging tools like Modus, Tessent, Spyglass, and VCS to deliver precision and quality.
Comprehensive DFT Services
- Consultation on the most effective DFT methodologies for any design.
- Comprehensive DFT rule checking and testability analysis.
- BIST integration for memory and logic circuits.
- Fault simulation and grading to ensure quality and performance.
- Full-cycle DFT support, from RTL-level verification to silicon testing.
Specialized in analog and mixed-signal IC design services.